Adam Cron

Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test

Adam W. Ley, Bambang Suparjo, Adam Cron, 2006, 2006 IEEE International Test Conference.

Read about the design-for-3D-test architecture and implementation flow developed by researchers at Industrial Technology Research Institute based on the Synopsys test solution.

Chen-An Chen, Yee-Wen Chen, Adam Cron, 2011 .

Status of IEEE testability standards 1149.4, 1532 and 1149.6

Adam Osseiran, Ben Bennetts, Stephen K. Sunter, 2004, Proceedings Design, Automation and Test in Europe Conference and Exhibition.

P1149.4 Mixed-Signal Test Bus

Adam Cron, 1996, IEEE Design & Test of Computers.

IEEE P1149.4-almost a standard

Adam Cron, 1997, Proceedings International Test Conference 1997.

IEEE Std P1838's flexible parallel port and its specification with Google's protocol buffers

Ming Shao, Erik Jan Marinissen, Yu Li, 2018, 2018 IEEE 23rd European Test Symposium (ETS).

IEEE Std P1838: 3D test access standard under development

Erik Jan Marinissen, Sandeep Kumar Goel, Adam Cron, 2019 .

IEEE Standard 1838 Is on the Move

Erik Jan Marinissen, Adam Cron, Riccardo Mariani, 2021, Computer.

Invited: End-to-End Secure SoC Lifecycle Management

Mark Mohammad Tehranipoor, Farimah Farahmandi, Fahim Rahman, 2021, 2021 58th ACM/IEEE Design Automation Conference (DAC).