张进城

Fabrication and characterization of groove-gate MOSFETs based on a self-aligned CMOS process

张卫东, 马晓华, 任红霞, 2006 .

High-electric-field-stress-induced degradation of SiN passivated AlGaN/GaN high electron mobility transistors

倪金玉, 马晓华, 郝跃, 2009 .