Robyn Sue Coleman

Development of a test vehicle for defect detection on 4- and 16-Mbit devices

Robyn Sue Coleman, Raleigh Estrada, Gary Dickerson, 1990, Advanced Lithography.

Pareto charts for defect analysis with correlation of inline defects to failed bitmap data

Robyn Sue Coleman, Dave Kolar, Louis Breaux, 1994, Advanced Lithography.

Defect reduction strategies for submicron manufacturing: tools and methodologies

Robyn Sue Coleman, Prasanna R. Chitturi, 1991, Other Conferences.