Jonathan M. Williams
发表
Seton Bennett,
Martin J T Milton,
Seton Bennett,
2007
.
Alistair B. Forbes,
Martin J. T. Milton,
A. Forbes,
2009,
0905.3635.
I. Rungger,
Jonathan M. Williams,
J. Ireland,
2020,
The Review of scientific instruments.
Connor D. Shelly,
Jonathan M. Williams,
Becky King,
2018,
2018 Conference on Precision Electromagnetic Measurements (CPEM 2018).
D. White,
Jonathan M. Williams,
1996
.
Ralf Behr,
J. R. Pickering,
D. Henderson,
2011
.
P. Kleinschmidt,
Jonathan M. Williams,
N. E. Fletcher,
2002
.
Ralf Behr,
Torsten Funck,
Luis Palafox,
2006
.
Ralf Behr,
Jonathan M. Williams,
Blaise Jeanneret,
2010
.
Ralf Behr,
J. Niemeyer,
H Seppa,
2001
.
P. Patel,
P. Kleinschmidt,
Jonathan M. Williams,
2002
.
Ernest Houtzager,
Ralph Hornecker,
Helko E. van den Brom,
2016,
2016 Conference on Precision Electromagnetic Measurements (CPEM 2016).
D. Henderson,
Jonathan M. Williams,
1988
.
P. See,
I. Rungger,
Connor D. Shelly,
2018,
Physical Review Applied.
Jaroslav Bohacek,
Luca Callegaro,
Frédéric Overney,
2002,
Conference Digest Conference on Precision Electromagnetic Measurements.
P. Ohlckers,
R. Behr,
M. Akram,
2019,
IEEE Transactions on Applied Superconductivity.
D. A. Humphreys,
R. Behr,
F. Muller,
2004
.
Y. Pashkin,
S. Kafanov,
Jonathan M. Williams,
2021,
2112.07766.
Connor D. Shelly,
Jonathan M. Williams,
P. Meeson,
2019,
Physical Review Applied.
Characterization of a high-resolution analog-to-digital converter with a Josephson AC voltage source
Ralf Behr,
Günther Ramm,
Enrico Mohns,
2005,
IEEE Transactions on Instrumentation and Measurement.
Jonathan M. Williams,
Stephen P. Giblin,
S. Giblin,
2007,
IEEE Transactions on Instrumentation and Measurement.
Barry M. Wood,
Giancarlo Marullo-Reedtz,
Yasuhiko Sakamoto,
2003,
IEEE Trans. Instrum. Meas..
R. Yakimova,
R. Yakimova,
J. Williams,
2012,
1202.2985.
R. Hadfield,
P. See,
Connor D. Shelly,
2017,
2017 16th International Superconductive Electronics Conference (ISEC).