W. Vetter

发表

Structural Characterization Of Sic Epitaxial Layers Grown On Porous Sic Substrates

S. Saddow, M. Dudley, M. Shamsuzzoha, 2000 .

Synchrotron White Beam X-Ray Topography and High Resolution X-RayDiffraction Studies of Defects in SiC Substrates, Epilayers and Device Structures

M. Dudley, W. Vetter, X. Huang, 2004 .

SYNCHROTRON WHITE BEAM TOPOGRAPHY CHARACTERIZATION OF PHYSICAL VAPOR TRANSPORT GROWN ALN AND AMMONOTHERMAL GAN

M. Dudley, J. Kolis, B. Raghothamachar, 2002 .

A Simple Mapping Method for Elementary Screw Dislocations in Homoepitaxial SiC Layers

S. Ha, M. Skowronski, M. Dudley, 2002 .

Polytype identification in heteroepitaxial 3C-SiC grown on 4H-SiC mesas using synchrotron white beam X-ray topography

P. Neudeck, M. Dudley, W. Vetter, 2002 .

Growth Defect Studies in SiC Single Crystals

M. Dudley, W. Vetter, 1996 .

Hexagonal voids and the formation of micropipes during SiC sublimation growth

M. Skowronski, M. Dudley, W. Vetter, 2001 .

Characterization of 3C-SiC Films Grown on 4H- and 6H-SiC Substrate Mesas during Step-Free Surface Hetero-Epitaxy

P. Neudeck, M. Skowronski, M. Dudley, 2003 .

Synchrotron white-beam topographic studies of 2H–SiC crystals

P. Neudeck, M. Dudley, J. Powell, 2001 .

Homogeneous Desulfurization of Thiols and Sulfides by Yb[N(SiMe3)2]2.2 THF. Relevance to Heterogeneous and Biological Desulfurizations and the Synthesis of Lanthanide(II) Sulfides

Ayusman Sen, H. Stecher, W. Vetter, 1990 .

Growth Mechanism and Dislocation Characterization of Silicon Carbide Epitaxial Films

Yi Chen, M. Dudley, Hui Zhang, 2006 .

Investigations of Non-Micropipe X-Ray Imaged Crystal Defects in SiC Devices

P. Neudeck, M. Dudley, H. Su, 2000 .

Reactivity of platinum and palladium α-ketoacyl complexes toward olefins and acetylenes

Ayusman Sen, W. Vetter, 1989 .

Synthesis, characterization, and reactivity of .alpha.-ketoacyl complexes of platinum(II) and palladium(II). Crystal structures of trans-Pt(PPh3)2(Cl)(COCOPh) and cis-Pt(PPh3)2(COPh)(CO2Me)

Ayusman Sen, Jwu-Ting Chen, W. Vetter, 1987 .

The perfection and defect structure of organic hourglass inclusion K2SO4 crystals

M. Dudley, B. Kahr, W. Vetter, 2002 .

The character of micropipes in silicon carbide crystals

M. Dudley, W. Vetter, 2006 .

Transmission electron microscopy studies of dislocations in physical-vapour-transport-grown silicon carbide

M. Dudley, W. Vetter, Michael Dudley, 2001 .

Recognition of Dyes by K2SO4 Crystals: Choosing Organic Guests for Simple Salts

B. Kahr, W. Vetter, B. Janssens, 1994 .

Direct evidence of micropipe-related pure superscrew dislocations in SiC

C. Carter, M. Dudley, W. Vetter, 1999 .

High-resolution x-ray topography of dislocations in 4H-SiC epilayers

H. Tsuchida, I. Kamata, M. Dudley, 2007 .

Superscrew dislocation contrast on synchrotron white-beam topographs: an accurate description of the direct dislocation image

C. Carter, M. Dudley, W. Si, 1999 .

Oxidation-Induced Crystallographic Transformation in Heavily N-Doped 4H-SiC Wafers

C. Poweleit, M. Dudley, B. Skromme, 2002 .

The Effect of Surface Finish on the Dislocation Density in Sublimation grown SiC Layers

M. Skowronski, M. Dudley, W. Mitchel, 2000 .

Recombination-enhanced defect motion in forward-biased 4H–SiC p-n diodes

Michael Dudley, H. Lendenmann, Marek Skowronski, 2002 .

Structural Distortion of the TpCo-L Fragment (Tp = tris(pyrazolyl)borate). Analysis by X-ray Diffraction and Density Functional Theory

D. Doren, K. Theopold, J. L. Detrich, 1996 .

Extended SiC Defects: Polarized Light Microscopy Delineation and Synchrotron White-Beam X-Ray Topography Ratification

M. Dudley, T. Sudarshan, W. Vetter, 2003 .

Contribution of x-ray topography and high-resolution diffraction to the study of defects in SiC

M. Dudley, X. Huang, W. Vetter, 2003 .

Enlargement of step-free SiC surfaces by homoepitaxial web growth of thin SiC cantilevers

P. Neudeck, G. Beheim, M. Dudley, 2002 .

Synchrotron white-beam X-ray topography of ribonuclease S crystals.

M. Dudley, D. Gallagher, W. Vetter, 2002, Acta crystallographica. Section D, Biological crystallography.

Harmonic composition of synchrotron white-beam X-ray topographic back-reflection images of basal-cut silicon carbide single-crystal wafers

M. Dudley, W. Vetter, 1998 .

Assessment of Polishing-Related Surface Damage in Silicon Carbide

S. Ha, M. Skowronski, M. Dudley, 2002 .

X-ray topographic dislocation contrast visible in reflections orthogonal to the Burgers vectors of axial screw dislocations in hexagonal silicon carbide

M. Dudley, W. Vetter, 2001 .

Nucleation of threading dislocations in sublimation grown silicon carbide

M. Graef, M. Skowronski, M. Dudley, 2002 .

Basal plane slip and formation of mixed-tilt boundaries in sublimation-grown hexagonal polytype silicon carbide single crystals

Michael Dudley, Marek Skowronski, S. Ha, 2002 .

Comparison between Measurement Techniques Used for Determination of the Micropipe Density in SiC Substrates

A. Weber, M. Dudley, J. Oliver, 2006 .

Partial dislocations in the X-ray topography of as-grown hexagonal silicon carbide crystals

M. Dudley, W. Vetter, 2001 .

Synchrotron white beam X-ray topography, transmission electron microscopy and high-resolution X-ray diffraction studies of defects and strain relaxation processes in wide band gap semiconductor crystals and thin films

M. Dudley, B. Raghothamachar, G. Dhanaraj, 2006 .

Effects of Structural Defects on Diode Properties in 4H-SiC

M. Dudley, B. Skromme, S. Mahajan, 2002 .

Characterization of defects in 3C-silicon carbide crystals

M. Dudley, W. Vetter, 2004 .

THE CONTRAST OF INCLUSIONS COMPARED WITH THAT OF MICROPIPES IN BACK-REFLECTION SYNCHROTRON WHITE BEAM TOPOGRAPHS OF SIC

M. Dudley, W. Vetter, 2004 .

Open-ended stacking-fault tetrahedra in X-ray topographs of cubic silicon carbide

M. Dudley, W. Vetter, 2003 .

Simulation of Threading Dislocation Images in X-ray Topographs of Silicon Carbide Homo-Epilayers

H. Tsuchida, I. Kamata, M. Dudley, 2005 .

The Characterization of Defects in Silicon Carbide Crystals by X-Ray Topography in the Back-Reflection Geometry

W. Vetter, 2004 .

Surface-relaxation contributions to axial screw dislocation contrast in synchrotron white-beam X-ray topographs of SiC

M. Dudley, W. Vetter, 2002 .

Micropipes and the closure of axial screw dislocation cores in silicon carbide crystals

M. Dudley, W. Vetter, 2004 .

Behavior of Basal Plane Dislocations and Low Angle Grain Boundary Formation in Hexagonal Silicon Carbide

Yi Chen, M. Dudley, R. Ma, 2007 .

Dislocation loops formed during the degradation of forward-biased 4H–SiC p-n junctions

M. Skowronski, H. Lendenmann, M. Dudley, 2003 .

Micropipes in silicon carbide crystals: Do all screw dislocations have open cores?

M. Dudley, W. Vetter, 2000 .

MATERIAL DEFECTS IN 4H-SILICON CARBIDE DIODES

A. Hallén, M. Dudley, U. Zimmermann, 2003 .

Contrast Mechanism in Superscrew Dislocation Images on Synchrotron Back-Reflection Topographs

C. Carter, M. Dudley, W. Vetter, 1998 .

Homoepitaxial 'Web Growth' of SiC to Terminate C-Axis Screw Dislocations and Enlarge Step-Free Surfaces

P. Neudeck, G. Beheim, M. Dudley, 2002 .

Effects of Different Defect Types on the Performance of Devices Fabricated on a 4H-SiC Homoepitaxial Layer

Yu Wang, M. Dudley, B. Skromme, 2006 .

Synchrotron White Beam X-Ray Topography and High Resolution Triple Axis X-Ray Diffraction Studies of Defects in SiC Substrates, Epilayers and Devices

P. Neudeck, M. Dudley, W. Vetter, 2003 .