Hailin Hu

DETERMINATION OF THE COMPLEX REFRACTIVE INDEX OF POROUS SILICON LAYERS ON CRYSTALLINE SILICON SUBSTRATES

R. Nava, Hailing Hu, J. A. Río, 2010 .

NO2-induced optical absorbance changes in semiconductor polyaniline thin films

Augusto García-Valenzuela, Hailing Hu, A. García-Valenzuela, 2004 .

Field Inspection of PV Modules: Quantitative Determination of Performance Loss due to Cell Cracks Using EL Images

Govindasamy Tamizhmani, Sai Tatapudi, Jaewon Oh, 2017 .