B. Trui

Thermal stability of CoSi2 layers implemented in a silicon-on-insulator substrate

Maik Wiemer, V. Dudek, Qing-Tai Zhao, 2006 .

Integration and optimization of embedded-sige, compressive and tensile stressed liner films, and stress memorization in advanced SOI CMOS technologies

D. Greenlaw, H.-J. Engelmann, N. Kepler, 2005, IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..