R. Yamada
发表
Y. Mori,
K. Ohyu,
M. Moniwa,
2006,
IEEE Transactions on Electron Devices.
J. Yugami,
T. Sekiguchi,
H. Kume,
2001,
2001 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.01 CH37184).
Tsu-Jae King,
T. King,
R. Yamada,
2003,
2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual..
Y. Okuyama,
R. Yamada,
T. Ishida,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
Y. Mori,
T. Mine,
H. Kume,
2008,
2008 IEEE International Reliability Physics Symposium.
T. Mine,
D. Hisamoto,
Y. Shimamoto,
2008,
IEEE Electron Device Letters.
A. Kotabe,
T. Osabe,
H. Kurata,
2007,
2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual.
T. Mine,
D. Hisamoto,
Y. Shimamoto,
2013,
IEEE Transactions on Electron Devices.