Umesh K Mishra

N-Polar InAlN/AlN/GaN MIS-HEMTs

Nidhi, Feng Wu, Stacia Keller, 2010, IEEE Electron Device Letters.

Pulsed-IV Pulsed-RF Cold-FET Parasitic Extraction of Biased AlGaN/GaN HEMTs Using Large Signal Network Analyzer

Patrick Roblin, Christiane Poblenz, Siddharth Rajan, 2010, IEEE Transactions on Microwave Theory and Techniques.

Integrated Optical and Electrical Analysis: Identifying Location and Properties of Traps in AlGaN/GaN HEMTs During Electrical Stress

Martin Kuball, U. Mishra, M. Ťapajna, 2010, IEEE Electron Device Letters.