U. Hong

Influences of Cleaning Conditions and Elapse after Etch on Via Resistance in Multi-Level Cu Interconnects

J. H. Oh, U. Hong, S. Hah, 2003 .

Removal of Backside Particles by a Single Wafer Megasonic System

H. Sohn, Jin-Goo Park, Changhae Park, 2007 .

Simultaneous determination of alkali and alkaline earth metals by ion chromatography with neutral carrier-based ion-selective electrode detector

H. Nam, G. Cha, K. Paeng, 1995 .

Neutral carrier-based ion-selective electrode with similar sensitivity to different monovalent cations as a detector in ion chromatography

G. Cha, K. Paeng, U. Hong, 1994 .