Lantian Wang

发表

Contact CD variation check and contact/metal overlay check using a model based full chip verification software tool

Juhwan Kim, Lantian Wang, Daniel Zhang, 2005, Photomask Japan.

Reticle defect sizing of optical proximity correction defects using SEM imaging and image analysis techniques

Larry S. Zurbrick, Ellen R. Laird, Lantian Wang, 2000, Photomask Japan.

Energy Flux Method for Die-to-Database Inspection of Critical Layer Reticles

Lantian Wang, Zongchang Yu, William Volk, 2002, Photomask Technology.

Full-chip level MEEF analysis using model based lithography verification

Juhwan Kim, Lantian Wang, Daniel Zhang, 2005, SPIE Photomask Technology.

Extending TeraStar reticle inspection capability to the 90nm node through layer-specific algorithms

Maciej W. Rudzinski, Lantian Wang, William Volk, 2003, European Mask and Lithography Conference.

A New Statistical-Based Algorithm for Medical Image Feature Extraction

Kuo-Kun Tseng, Lantian Wang, Jiaqian Li, 2017 .

Resolution enhancement technique optimization using model-based full-chip verification methodology for subwavelength lithography

Juhwan Kim, Lantian Wang, Zongwu Tang, 2004, SPIE Photomask Technology.

LRC techniques for improved error detection throughout the process window

Jun Zhu, Lantian Wang, Shu-Mei Yang, 2007, SPIE Photomask Technology.

Energy flux method for inspection of contact and VIA layer reticles

Lantian Wang, Zongchang Yu, William Volk, 2003, SPIE Advanced Lithography.

New approaches to alternating phase-shift mask inspection

Larry S. Zurbrick, Maciej W. Rudzinski, Lantian Wang, 2002, SPIE Photomask Technology.

Correlating reticle pinhole defects to wafer printability for the 90-nm node lithography using advanced RET

Maciej W. Rudzinski, Kong Son, Lantian Wang, 2004, SPIE Advanced Lithography.

Full-chip poly gate critical dimension control using model based lithography verification

Juhwan Kim, Lantian Wang, Zongwu Tang, 2005, SPIE Photomask Technology.

Liver Cancer Detection Using Hybridized Fully Convolutional Neural Network Based on Deep Learning Framework

Lantian Wang, Yizhao Zhou, Xin Dong, 2020, IEEE Access.

Model-based full-chip verification for 65nm lithography process development

Juhwan Kim, Lantian Wang, Daniel Zhang, 2005, Photomask Japan.

Medical Image Diagnosis with Deep Learning on FPGA Platform

Kuo-Kun Tseng, Ran Zhang, Lantian Wang, 2018, ICGEC.

Alternating phase-shift mask inspection using multiple simultaneous illumunation techniques

Larry S. Zurbrick, Maciej W. Rudzinski, Lantian Wang, 2002, Photomask Japan.