V. Zajic

Heavy ion linear energy transfer measurements during single event upset testing of electronic devices

Peter Thieberger, V. Zajic, P. Thieberger, 1999 .

Design and performance of the matching beamline between the BNL EBIS and an RFQ

D. Raparia, J. Brodowski, J. Brodowski, 2007, 2007 IEEE Particle Accelerator Conference (PAC).

Heavy-ion beams for single-event research at Brookhaven — present and future

E. G. Stassinopoulos, Peter Thieberger, E. Stassinopoulos, 1991 .

Secondary Electron Yields and Their Dependence on the Angle of Incidence on Stainless Steel Surfaces for Three Energetic Ion Beams

A. L. Hanson, H. Ludewig, S. Y. Zhang, 1999 .