F. Uesugi
发表
N. Ito,
T. Moriya,
F. Uesugi,
2008
.
F. Uesugi,
T. Motomura,
2015,
2015 Joint e-Manufacturing and Design Collaboration Symposium (eMDC) & 2015 International Symposium on Semiconductor Manufacturing (ISSM).
Tsuyoshi Ohnishi,
Kazutaka Mitsuishi,
Masaki Takeguchi,
2018,
Microscopy.
H. Satake,
H. Saruwatari,
F. Uesugi,
2015
.
I. Nishiyama,
F. Uesugi,
1992
.
I. Nishiyama,
F. Uesugi,
1992
.
I. Nishiyama,
F. Uesugi,
1992
.
F. Uesugi,
T. Tabaru,
Y. Kasashima,
2016
.
N. Ito,
T. Moriya,
F. Uesugi,
2004
.
Control of behavior of particles flaked off an anode in plasma etch-back equipment by bias electrode
N. Ito,
T. Moriya,
F. Uesugi,
2000,
Proceedings of ISSM2000. Ninth International Symposium on Semiconductor Manufacturing (IEEE Cat. No.00CH37130).
M. Akiyama,
F. Uesugi,
Yoshikazu Kobayashi,
2013,
IEEE Transactions on Semiconductor Manufacturing.
F. Uesugi,
I. Hashimoto,
K. Kojima,
2008
.
J. Tominaga,
A. Kolobov,
P. Fons,
2020,
physica status solidi (RRL) – Rapid Research Letters.
K. Kimoto,
T. Nagai,
J. Kikkawa,
2020,
Ultramicroscopy.
F. Uesugi,
Y. Kasashima,
2016,
2016 International Symposium on Semiconductor Manufacturing (ISSM).
F. Uesugi,
Y. Kasashima,
2016
.
F. Uesugi,
Y. Kasashima,
2015,
The Review of scientific instruments.
A. Ando,
F. Uesugi,
Y. Kasashima,
2015
.
F. Uesugi,
T. Motomura,
Y. Kasashima,
2014
.
F. Uesugi,
T. Motomura,
Y. Kasashima,
2014
.
F. Uesugi,
Y. Kasashima,
N. Nabeoka,
2013
.
I. Nishiyama,
F. Uesugi,
1996
.
S. Kishida,
K. Washio,
H. Yokoyama,
1985
.
L. Qin,
Jie Tang,
Daiming Tang,
2020,
Nanoscale.
L. Qin,
Jie Tang,
M. Mitome,
2020,
Nano Research.
S. Kishida,
K. Washio,
H. Yokoyama,
1984
.
F. Uesugi,
2013,
Ultramicroscopy.
A. Hokazono,
F. Uesugi,
S. Takeno,
2011,
Ultramicroscopy.
T. Mizoguchi,
T. Miyata,
F. Uesugi,
2017,
Science Advances.
I. Nishiyama,
Y. Ohshita,
F. Uesugi,
1991
.
Jinshi Yuan,
L. Qin,
Jie Tang,
2020,
Nanoscale.
K. Kikunaga,
S. Hara,
Kazunori Takahashi,
2014
.
F. Uesugi,
T. Motomura,
Y. Kasashima,
2014
.
Chang Liu,
Hui‐Ming Cheng,
Y. Bando,
2021,
Science.
Accurate determination of strains at layered materials by selected area electron diffraction mapping
T. Ohnishi,
K. Mitsuishi,
T. Mano,
2019,
Japanese Journal of Applied Physics.
Iwao Nishiyama,
Fumihiko Uesugi,
I. Nishiyama,
1994
.
Chang Liu,
Hui‐Ming Cheng,
Y. Bando,
2018,
Ultramicroscopy.
F. Uesugi,
T. Motomura,
Y. Kasashima,
2014
.
F. Uesugi,
T Motomura,
Y Kasashima,
2014,
The Review of scientific instruments.
N. Ito,
T. Moriya,
F. Uesugi,
2000
.
H. Doi,
N. Ito,
T. Moriya,
1998
.
J. Tominaga,
A. Kolobov,
P. Fons,
2017,
Nanoscale.
F. Uesugi,
Y. Kasashima,
2014
.
S. Shimomura,
Kentaroh Watanabe,
F. Ishikawa,
2015,
Nano letters.
F. Uesugi,
Y. Kasashima,
S. Mitomi,
2017
.
Tsuyoshi Moriya,
Hiroshi Doi,
Fumihiko Uesugi,
1998
.
Y. Teraoka,
I. Nishiyama,
F. Uesugi,
1991
.
K. Ozawa,
T. Mochiku,
F. Uesugi,
2015
.
I. Nishiyama,
F. Uesugi,
1993
.
M. Koike,
M. Tomita,
F. Uesugi,
2008
.
A. Uedono,
M. Sumiya,
F. Uesugi,
2021,
Journal of Crystal Growth.
I. Nishiyama,
S. Kishida,
F. Uesugi,
2000
.