Naoto Noguchi

Generation of dislocations from scratches on GaN formed during wafer fabrication and dislocation reactions during homoepitaxial growth

M. Shimizu, Y. Sugawara, Y. Ishikawa, 2021, Japanese Journal of Applied Physics.

Monitoring of Substrate and Epilayer Surfaces by Mirror Projection Electron Microscope

H. Tsuchida, I. Kamata, Naoto Noguchi, 2019, Materials Science Forum.