Y. Narita
发表
T. Mishima,
N. Fukuhara,
F. Horikiri,
2019,
IEEE Transactions on Semiconductor Manufacturing.
Takehiro Yoshida,
Hiroshi Ohta,
Tomoyoshi Mishima,
2015,
IEEE Electron Device Letters.
F. Horikiri,
T. Yoshida,
Y. Narita,
2017
.
T. Mishima,
F. Horikiri,
T. Yoshida,
2018,
Applied Physics Express.
O. Ichikawa,
N. Fukuhara,
F. Horikiri,
2020,
Applied Physics Express.
F. Horikiri,
T. Yoshida,
Y. Narita,
2018,
Japanese Journal of Applied Physics.
T. Mishima,
F. Horikiri,
Tohru Nakamura,
2017,
IEEE Transactions on Semiconductor Manufacturing.
Effect of Wafer Off‐Angles on Defect Formation in Drift Layers Grown on Free‐Standing GaN Substrates
T. Mishima,
F. Horikiri,
K. Shiojima,
2020,
physica status solidi (b).
T. Mishima,
F. Horikiri,
T. Yoshida,
2021
.
T. Mishima,
F. Horikiri,
T. Yoshida,
2020,
IEEE Electron Device Letters.
T. Mishima,
F. Horikiri,
T. Yoshida,
2019,
Japanese Journal of Applied Physics.
T. Mishima,
F. Horikiri,
T. Yoshida,
2019,
Japanese Journal of Applied Physics.
O. Ichikawa,
N. Fukuhara,
F. Horikiri,
2021,
Journal of Applied Physics.
T. Mishima,
N. Fukuhara,
F. Horikiri,
2020,
Applied Physics Express.
T. Mishima,
N. Fukuhara,
F. Horikiri,
2019,
Applied Physics Express.
T. Mishima,
F. Horikiri,
K. Hayashi,
2018
.
T. Mishima,
N. Fukuhara,
T. Shinohe,
2021,
Japanese Journal of Applied Physics.
T. Mishima,
F. Horikiri,
Tohru Nakamura,
2017
.
T. Mishima,
N. Fukuhara,
F. Horikiri,
2020,
Japanese Journal of Applied Physics.
F. Horikiri,
Takeshi Kimura,
H. Fujikura,
2020
.
Hideo Kawanishi,
Takayoshi Takano,
Akihiko Horiuchi,
2004
.
N. Fukuhara,
F. Horikiri,
T. Yoshida,
2019,
Applied Physics Express.
N. Fukuhara,
F. Horikiri,
Y. Narita,
2021
.
S. Chichibu,
F. Horikiri,
H. Fujikura,
2019,
Applied Physics Express.