P. Fornara
发表
P. Masson,
J. Portal,
A. Régnier,
2015,
2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC).
A. Poncet,
P. Fornara,
1996,
International Electron Devices Meeting. Technical Digest.
J. Portal,
Y. Bert,
H. Aziza,
2011,
2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS).
D. Mangelinck,
P. Fornara,
A. Portavoce,
2007
.
O. Thomas,
P. Gergaud,
M. Gailhanou,
2005
.
P. Gonon,
P. Fornara,
J. Jacquot,
2019,
2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS).
P. Albarède,
F. Nemouchi,
D. Mangelinck,
2003
.
Pierre Montmitonnet,
Sebastian Orellana,
B. Arrazat,
2015,
Microelectron. Reliab..
Impact of hump effect on MOSFET mismatch in the sub-threshold area for low power analog applications
Hassen Aziza,
Pascal Fornara,
Franck Julien,
2010,
2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology.
M. Mouis,
S. Denorme,
A. Poncet,
1998
.
Jean-Luc Ogier,
Didier Goguenheim,
Pascal Fornara,
2009,
Microelectron. Reliab..