Charles Weber

发表

Senior Technical Eciitors

Larry J. Greenstein, Stephen B. Weinstein, Publisher M. Lof, 1985 .

Metrology-based control and profitability in the semiconductor industry

Charles Weber, 2001, SPIE LASE.

Generic test chip formats for ASIC-oriented semiconductor process development

Charles Weber, 1993, ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures.

A standardized method for CMOS unit process development

Charles Weber, 1992 .

Monitoring Community Noise

Charles Weber, Melville C. Branch, Samuel Gil Man, 1974 .

Head assembly and handle

Charles Weber, Timothy Scott Onello, 2012 .

Knowledge-based theories of the firm in strategic management : a review and extension

Georg von Krogh, Charles Weber, Sarah Kaplan, 2012 .

Standardization of CMOS unit process development

Charles Weber, 1989, Proceedings of the 1989 International Conference on Microelectronic Test Structures.

Proposed Improvements in Automotive Modularity: An Assessment of the Competitive Position of a Novel Reinforced Plastics Molding Technology

Charles Weber, John Busch, J. Busch, 2000 .

Knowledge transfer and the limits to profitability: an empirical study of problem-solving practices in semiconductor manufacturing and process development

Charles Weber, C. Weber, 2002, ASMC 2002.

Standard Defect Monitor

Charles Weber, 1988, Proceedings of the IEEE International Conference on Microelectronic Test Structures.

Measurement Maturity and the CMM: How Measurement Practices Evolve as Processes Mature

Charles Weber, Beth Layman, 2002 .

DoLearning Organizations haveStrokes ofGenius

Charles Weber, 2006 .

Yield learning and the sources of profitability in semiconductor manufacturing and process development

Charles Weber, 2002, 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002 (Cat. No.02CH37259).