E. Fitzgerald

Scanning probe tips formed by focused ion beams

M. J. Vasile, J. E. Griffith, D. A. Grigg, 1991 .

Scanning probe tip geometry optimized for metrology by focused ion beam ion milling

P. Russell, M. Vasile, J. Griffith, 1991 .

Characterization of scanning probe microscope tips for linewidth measurement

M. J. Vasile, J. E. Griffith, D. A. Grigg, 1991 .