Lei Yuan

Shot noise models for sequential processes and the role of lateral mixing

Erik H. Anderson, Andrew R. Neureuther, Wojtek J. Poppe, 2006 .

Improving resist resolution and sensitivity via electric-field enhanced postexposure baking

Ebo H. Croffie, A. Neureuther, Lei Yuan, 2002 .

Overcoming scaling barriers through design technology CoOptimization

Lei Yuan, Jongwook Kye, Guillaume Bouche, 2016, 2016 IEEE Symposium on VLSI Technology.

Enhancement of resist resolution and sensitivity via applied electric field

Ebo H. Croffie, A. Neureuther, Lei Yuan, 2000 .