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Hopping conduction distance dependent activation energy characteristics of Zn:SiO2 resistance random access memory devices

Rui Zhang, Jung-Hui Chen, Simon M. Sze, 2013 .

Performance and characteristics of double layer porous silicon oxide resistance random access memory

Rui Zhang, Jung-Hui Chen, Simon M. Sze, 2013 .

Characteristics of hafnium oxide resistance random access memory with different setting compliance current

Rui Zhang, Jung-Hui Chen, Simon M. Sze, 2013 .

Atomic-level quantized reaction of HfOx memristor

Ming-Jinn Tsai, Simon M. Sze, Kuan-Chang Chang, 2013 .

Memory characteristics of Co nanocrystal memory device with HfO

S. M. Sze, S. Sze, J. Lin, 2007 .