Michael P. King

Effects of Energy-Deposition Variability on Soft Error Rate Prediction

Nicholas C. Hooten, Robert C. Baumann, Ronald D. Schrimpf, 2015, IEEE Transactions on Nuclear Science.

Vertical GaN Power Diodes With a Bilayer Edge Termination

Isik C. Kizilyalli, Michael W. Moseley, Ozgur Aktas, 2016, IEEE Transactions on Electron Devices.

Physical Processes and Applications of the Monte Carlo Radiative Energy Deposition (MRED) Code

Ronald D. Schrimpf, Daniel M. Fleetwood, Elizabeth C. Auden, 2015, IEEE Transactions on Nuclear Science.