S. De Gendt
发表
A. Vandooren,
D. Leonelli,
R. Rooyackers,
2011,
IEEE 2011 International SOI Conference.
S. De Gendt,
Z. el Otell,
D. Marinov,
2015,
Advanced Lithography.
S. De Gendt,
G. Groeseneken,
B. Kaczer,
2014,
2014 IEEE International Reliability Physics Symposium.
S. De Gendt,
A. Vaglio Pret,
Z. el Otell,
2014,
Advanced Lithography.
S. De Gendt,
W. Boullart,
A. Vaglio Pret,
2013,
Advanced Lithography.
S. De Gendt,
G. Groeseneken,
B. Kaczer,
2015,
2015 Symposium on VLSI Technology (VLSI Technology).
S. De Gendt,
B. Kaczer,
W. Zhang,
2016,
2016 IEEE International Electron Devices Meeting (IEDM).
S. De Gendt,
G. Groeseneken,
B. Kaczer,
2013,
2013 IEEE International Electron Devices Meeting.
S. De Gendt,
M. Heyns,
M. Caymax,
2003,
2003 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.03CH37407).
S. De Gendt,
S. Van Elshocht,
H. Bender,
2015,
Chemical communications.
S. De Gendt,
L. Pantisano,
R. Degraeve,
2004,
IEEE Transactions on Electron Devices.
S. De Gendt,
L. Pantisano,
M. Heyns,
2003,
IEEE International Electron Devices Meeting 2003.
S. De Gendt,
M. Heyns,
T. Schram,
2004,
Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850).
S. De Gendt,
R. Degraeve,
G. Groeseneken,
2007,
IEEE Transactions on Electron Devices.
S. De Gendt,
S. Van Elshocht,
L. Pantisano,
2006,
IEEE Transactions on Electron Devices.
S. De Gendt,
L. Pantisano,
R. Degraeve,
2004,
Proceedings of the 11th International Symposium on the Physical and Failure Analysis of Integrated Circuits. IPFA 2004 (IEEE Cat. No.04TH8743).
A. Vandooren,
D. Leonelli,
R. Rooyackers,
2010,
2010 Proceedings of the European Solid State Device Research Conference.
S. De Gendt,
D. Pique,
S. Van Elshocht,
2003,
2003 International Symposium on VLSI Technology, Systems and Applications. Proceedings of Technical Papers. (IEEE Cat. No.03TH8672).
S. De Gendt,
S. Van Elshocht,
A. Akheyar,
2007,
2007 IEEE International Electron Devices Meeting.
S. De Gendt,
R. Degraeve,
G. Groeseneken,
2006,
2006 IEEE International Reliability Physics Symposium Proceedings.
S. De Gendt,
L. Pantisano,
Zhigang Ji,
2008,
IEEE Electron Device Letters.
S. De Gendt,
G. Groeseneken,
M. Houssa,
2007,
IEEE Transactions on Device and Materials Reliability.
S. De Gendt,
J. Rip,
S. De Gendt,
2005,
IEEE Transactions on Device and Materials Reliability.
S. De Gendt,
R. Degraeve,
B. Kaczer,
2005,
IEEE Electron Device Letters.
R. Rooyackers,
S. De Gendt,
S. Locorotondo,
2005,
2005 International Conference on Integrated Circuit Design and Technology, 2005. ICICDT 2005..
S. De Gendt,
S. Severi,
L. Pantisano,
2006,
IEEE Electron Device Letters.
S. De Gendt,
L. Pantisano,
A. Kerber,
2003,
IEEE International Electron Devices Meeting 2003.
S. De Gendt,
G. Groeseneken,
M. Houssa,
2004,
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004..
S. De Gendt,
B. Kaczer,
Zhigang Ji,
2013,
IEEE Transactions on Electron Devices.
S. De Gendt,
S. Severi,
G. Groeseneken,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
S. De Gendt,
R. Degraeve,
B. Kaczer,
2005,
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
S. De Gendt,
N. Collaert,
W. Boullart,
2005,
Digest of Technical Papers. 2005 Symposium on VLSI Technology, 2005..
V. Kilchytska,
D. Flandre,
R. Rooyackers,
2005,
Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005..