Yun Young Yeoh

High performance twin silicon nanowire MOSFET(TSNWFET) on bulk si wafer

Sung Min Kim, Chang Woo Oh, Sung Hwan Kim, 2008, 2006 IEEE Nanotechnology Materials and Devices Conference.

Characteristics of sub 5nm tri-gate nanowire MOSFETs with single and poly Si channels in SOI structure

Kyoung Hwan Yeo, Dong-Won Kim, S. Suk, 2006, 2009 Symposium on VLSI Technology.

Investigation on hot carrier reliability of Gate-All-Around Twin Si Nanowire Field Effect Transistor

Kyoung Hwan Yeo, Dong-Won Kim, G. Jin, 2009, 2009 IEEE International Reliability Physics Symposium.

Experimental Investigation on Superior PMOS Performance of Uniaxial Strained ≪110≫ Silicon Nanowire Channel By Embedded SiGe Source/Drain

Donggun Park, Keun Hwi Cho, Kyoung Hwan Yeo, 2007, 2007 IEEE International Electron Devices Meeting.

TSNWFET for SRAM cell application: Performance variation and process dependency

Donggun Park, Dong Won Kim, Kyoung Hwan Yeo, 2008, 2008 Symposium on VLSI Technology.

Temperature-Dependent Characteristics of Cylindrical Gate-All-Around Twin Silicon Nanowire MOSFETs (TSNWFETs)

Donggun Park, Sung Woo Hwang, Keun Hwi Cho, 2007, IEEE Electron Device Letters.

Characteristics of the Series Resistance Extracted From Si Nanowire FETs Using the $Y$ -Function Technique

Yoon-Ha Jeong, Chang-Ki Baek, Rock-Hyun Baek, 2010, IEEE Transactions on Nanotechnology.

Characterization and Modeling of 1/$f$ Noise in Si-nanowire FETs: Effects of Cylindrical Geometry and Different Processing of Oxides

Yoon-Ha Jeong, Hyun-Sik Choi, Chang-Ki Baek, 2011, IEEE Transactions on Nanotechnology.