T.-P. Ma
发表
Y. Nishioka,
T. Ma,
Y. Nishioka,
1988,
IEEE Electron Device Letters.
Y.C. Cheng,
C. Sodini,
T. Ma,
1992,
IEEE Electron Device Letters.
Y. Ohji,
K. Ohyu,
K. Mukai,
1989,
IEEE Electron Device Letters.
W. Chen,
T.-P. Ma,
1992,
IEEE Electron Device Letters.
T.-P. Ma,
M.-H. Tsai,
1993,
IEEE Electron Device Letters.
A. Balasinski,
A. Acovic,
C.C.-H. Hsu,
1992,
IEEE Electron Device Letters.
Y. Nishioka,
M. Kato,
T.-P. Ma,
1989,
IEEE Electron Device Letters.
Y. Ohji,
Y. Nishioka,
T. Ma,
1991,
IEEE Electron Device Letters.
Hot-carrier effects on interface-trap capture cross sections in MOSFETs as studied by charge pumping
A. Balasinski,
W. Chen,
T.-P. Ma,
1992,
IEEE Electron Device Letters.
Y. Ohji,
K. Ohyu,
Y. Nishioka,
1989,
IEEE Electron Device Letters.
L. Vishnubhotla,
T. Ma,
P. Tobin,
1993,
IEEE Electron Device Letters.
Eronides F. da Silva,
Yasushiro Nishioka,
T. Ma,
1987,
IEEE Transactions on Nuclear Science.
W. Chen,
T.-P. Ma,
1991,
IEEE Electron Device Letters.