Z. Gao
发表
C. De Santi,
G. Meneghesso,
M. Meneghini,
2019,
Microelectronics Reliability.
F. Calle,
Z. Gao,
M. Romero,
2018,
IEEE Transactions on Electron Devices.
F. Calle,
E. San Andrés,
M. Pampillón,
2015,
2015 10th Spanish Conference on Electron Devices (CDE).
F. Calle,
Z. Gao,
M. Romero,
2013,
2013 Spanish Conference on Electron Devices.
M. Meneghini,
G. Meneghesso,
F. Rampazzo,
2020,
2107.08413.
M. Meneghini,
G. Meneghesso,
F. Rampazzo,
2019,
Microelectronics Reliability.
F. Calle,
A. Redondo-Cubero,
M. Pampillón,
2017
.
F. Calle,
E. San Andrés,
A. Redondo-Cubero,
2017,
IEEE Electron Device Letters.