J. Wright

Reliability, yield, and performance of a 90 nm SOI/Cu/SiCOH technology

J. Gill, C.-C. Yang, A. Carbone, 2004, Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729).

Comprehensive reliability evaluation of a 90 nm CMOS technology with Cu/PECVD low-k BEOL

J. Gill, C.-C. Yang, A. Carbone, 2004, 2004 IEEE International Reliability Physics Symposium. Proceedings.

Chip-to-package interaction for a 90 nm Cu / PECVD low-k technology

C.-C. Yang, A. Cowley, D. Questad, 2004, Proceedings of the IEEE 2004 International Interconnect Technology Conference (IEEE Cat. No.04TH8729).