H. Saka

Observation of four-phase lamellar structure from a tetrablock quarterpolymer of the ABCD type

Yushu Matsushita, Atsushi Takano, Shigeo Arai, 2003 .

SIDE-WALL DAMAGE IN A TRANSMISSION ELECTRON MICROSCOPY SPECIMEN OF CRYSTALLINE SI PREPARED BY FOCUSED ION BEAM ETCHING

H. Saka, H. Saka, Naoko Kato, 1999 .

Transmission electron microscopy observation of thin foil specimens prepared by means of a focused ion beam

H. Saka, H. Saka, 1998 .