Mariam Melhem

Prediction of the Wafer quality with respect to the production equipments data

Mustapha Ouladsine, Bouchra Ananou, Mariam Melhem, 2015 .

Regularized regression models to predict the product quality in multistep manufacturing

Mustapha Ouladsine, Jacques Pinaton, Bouchra Ananou, 2016, 2016 5th International Conference on Systems and Control (ICSC).

8th IFAC Conference on Manufacturing Modelling, Management and Control

Mustapha Ouladsine, Jacques Pinaton, Bouchra Ananou, 2016 .

Regression Methods for Predicting the Product’s Quality in the Semiconductor Manufacturing Process

Mustapha Ouladsine, Jacques Pinaton, Bouchra Ananou, 2016 .

Analysis of similarities between alarm events in the semiconductor manufacturing process

Mustapha Ouladsine, Jacques Pinaton, Bouchra Ananou, 2017, 2017 25th Mediterranean Conference on Control and Automation (MED).

Product quality prediction using alarm data : Application to the semiconductor manufacturing process

Mustapha Ouladsine, Jacques Pinaton, Bouchra Ananou, 2017, 2017 25th Mediterranean Conference on Control and Automation (MED).