Amir Sagiv

发表

Aerial imaging for source mask optimization: mask and illumination qualification

Jo Finders, Shmoolik Mangan, Ilan Englard, 2009, Photomask Technology.

Towards 22 nm: fast and effective intra-field monitoring and optimization of process windows and CDU

Jo Finders, Huixiong Dai, Shmoolik Mangan, 2011, Advanced Lithography.

Practical application of aerial imaging mask inspection for memory devices

Yong-Hoon Kim, Shmoolik Mangan, Eun Young Park, 2008, Photomask Japan.

Contact area as the intuitive definition of contact CD based on aerial image analysis

Shmoolik Mangan, Netanel Polonsky, Amir Sagiv, 2009, Advanced Lithography.

Aerial imaging qualification and metrology for source mask optimization

Jo Finders, Shmoolik Mangan, Andre Engelen, 2010, Advanced Lithography.

Toward 22 nm: fast and effective intrafield monitoring and optimization of process windows and critical dimension uniformity

Jo Finders, Huixiong Dai, Chris Ngai, 2011 .

Transport and Interface: An Uncertainty Principle for the Wasserstein Distance

Stefan Steinerberger, Amir Sagiv, 2020, SIAM J. Math. Anal..

Kernel-based parameter estimation of dynamical systems with unknown observation functions pdf

Ofir Lindenbaum, Ronen Talmon, Amir Sagiv, 2020, Chaos.

What you see is what you print: aerial imaging as an optimal discriminator between printing and non-printing photomask defects

Shmoolik Mangan, Amir Sagiv, 2008, Photomask Japan.

EUV mask: detection studies with Aera2

Shmoolik Mangan, Amir Sagiv, T. Verdene, 2010, Advanced Lithography.

Density Estimation in Uncertainty Propagation Problems Using a Surrogate Model

Gadi Fibich, Amir Sagiv, Adi Ditkowski, 2018, SIAM/ASA J. Uncertain. Quantification.

Aerial imaging as a unique photomask defect printability classifier

Amir Sagiv, 2008 .

Spectral convergence of probability densities pdf

Amir Sagiv, A. Sagiv, 2021, ArXiv.

Computational inspection applied to a mask inspection system with advanced aerial imaging capability

Vikram Tolani, Linyong Pang, Thuc Dam, 2010, Photomask Japan.

A novel approach to mask defect inspection

Shmoolik Mangan, Amir Sagiv, Yuri Shirman, 2008, Photomask Technology.

The Wasserstein distances between pushed-forward measures with applications to uncertainty quantification

Amir Sagiv, A. Sagiv, 2019, Communications in Mathematical Sciences.

IntenCD: mask critical dimension variation mapping

Shmoolik Mangan, Lior Shoval, Netanel Polonsky, 2008, Photomask Japan.

Improved mask-based CD uniformity for gridded-design-rule lithography

Shmoolik Mangan, Lev Faivishevsky, Amir Sagiv, 2009, Advanced Lithography.

Minimizing optimal transport for functions with fixed-size nodal sets

Amir Sagiv, Qiang Du, 2021 .

Effective gaps in continuous Floquet Hamiltonians

Michael I. Weinstein, Amir Sagiv, 2021 .

Kernel-based parameter estimation of dynamical systems with unknown observation functions

Ofir Lindenbaum, Ronen Talmon, Amir Sagiv, 2021, Chaos.

Radiative decay of edge states in Floquet media

Michael I. Weinstein, Amir Sagiv, Sameh N. Hameedi, 2022 .

Collective Processes in Relativistic Plasma and Their Implications for Gamma-Ray Burst Afterglows

Amir Sagiv, Eli Waxman, E. Waxman, 2002, astro-ph/0202337.