I. Konvalina

发表

Imaging Ferroelectric Nanodomains in Strained BiFeO3 Nanoscale Films Using Scanning Low-Energy Electron Microscopy: Implications for Low-Power Devices

Deyang Chen, I. Müllerová, Xiaozhe Yin, 2021 .

Quantitative comparison of simulated and measured signals in the STEM mode of a SEM

I. Müllerová, L. Frank, I. Konvalina, 2018 .

Low and Ultra-low Energy Scanning Electron Microscopy of 2D Transition Metal Dichalcogenides: Experiments and Simulations

M. Lejeune, L. Frank, I. Konvalina, 2018, Microscopy and Microanalysis.

The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements

I. Müllerová, L. Frank, I. Konvalina, 2021, Microscopy and Microanalysis.

Acquisition of the Angular Distribution of Backscattered Electrons at Low Energies

I. Müllerová, I. Konvalina, L. Frank, 2007 .

A Novel Class of Growth Factors Related to Herpesviruses

I. Konvalina, F. Golais, J. Gašperík, 2002 .

Quantification of STEM Images in High Resolution SEM for Segmented and Pixelated Detectors

I. Müllerová, I. Konvalina, M. Zouhar, 2021, Nanomaterials.

Very Low Energy Scanning Electron Microscopy

I. Müllerová, L. Frank, M. Hovorka, 2011 .

Making Sense of Complex Carbon and Metal/Carbon Systems by Secondary Electron Hyperspectral Imaging

Stephan J. Kyle, M. Dapor, K. Abrams, 2019, Advanced science.

Scanning transmission low-energy electron microscopy

Ilona Müllerová, Ludek Frank, Milos Hovorka, 2011, IBM J. Res. Dev..

Low-Energy Electron Inelastic Mean Free Path of Graphene Measured by a Time-of-Flight Spectrometer

W. Werner, I. Müllerová, L. Frank, 2021, Nanomaterials.

In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM

I. Müllerová, I. Konvalina, F. Mika, 2019, Materials.

Properties of the cathode lens combined with a focusing magnetic/immersion-magnetic lens

Ilona Müllerová, Ivo Konvalina, I. Müllerová, 2011 .

The Simulation of Energy Distribution of Electrons Detected by Segmental Ionization Detector in High Pressure Conditions of ESEM

I. Konvalina, V. Neděla, M. Oral, 2015, Microscopy and Microanalysis.

Comparison of calculated, simulated and measured signal amplification in a variable pressure SEM

I. Konvalina, V. Neděla, B. Lencová, 2011 .

Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer

M. Lejeune, I. Müllerová, L. Frank, 2020 .

Contamination Mitigation Strategy for Ultra-Low Energy Electron Microscopy and Spectroscopy

I. Müllerová, L. Frank, I. Konvalina, 2019, Microscopy and Microanalysis.

In-Lens Band-Pass Filter for Secondary Electrons in Ultrahigh Resolution SEM

I. Müllerová, I. Konvalina, F. Mika, 2019, Materials.

Imaging with STEM Detector, Experiments vs. Simulation

I. Müllerová, I. Konvalina, C. Walker, 2015, Microscopy and Microanalysis.

Deep Learning-Powered Optical Microscopy for Steel Research

Š. Mikmeková, I. Konvalina, M. Zouhar, 2024, Machine Learning and Knowledge Extraction.