Cheong-Sool Park

发表

THE PROBABILITY PREDICTION OF FAULT STATE USING CASE-BASED REASONING WITH RANDOM FOREST

Jun-Geol Baek, Bong-Geun Song, S. Park, 2016 .

Feature-Learning-Based Printed Circuit Board Inspection via Speeded-Up Robust Features and Random Forest

Jun-Geol Baek, Seung Hwan Park, Cheong Sool Park, 2018, Applied Sciences.

Pattern Recognition using Wavelet based Neural Networks

Sung-Shick Kim, Jun-Geol Baek, Cheong-Sool Park, 2013 .

A Study of Estimation Method for Auto-Regressive Model with Non-Normal Error and Its Prediction Accuracy

Sung-Shick Kim, Jun-Geol Baek, Cheong-Sool Park, 2013 .

A Parallel Hopfield Neural Network without Oscillations

Hyunsoo Yoon, J. H. Nang, Cheong-Sool Park, 1992 .

Clustering Mixed Data Using Non-normal Regression Tree for Process Monitoring

Cheong-Sool Park, Jun-Geol Baek, Young-Hak Lee, 2012 .

Algorithm learning based neural network integrating feature selection and classification

Hyunsoo Yoon, Cheong-Sool Park, Jun-Geol Baek, 2013, Expert Syst. Appl..

Model Parameter Based Fault Detection for Time-series Data

Cheong-Sool Park, Jun-Geol Baek, Sung-Shick Kim, 2011 .

Multi-objective Genetic Algorithm for Variable Selection in Linear Regression Model and Application

Cheong-Sool Park, Jun-Geol Baek, Sung-Shick Kim, 2009 .

Control Chart Pattern Recognition of Manufacturing Process Using Wavelet Feature-Based Artificial Neural Networks

Jun-Geol Baek, Sung Shick Kim, Hyo Heon Ko, 2012 .

A Study on Improving Classification Performance for Manufacturing Process Data with Multicollinearity and Imbalanced Distribution

Cheong-Sool Park, Jun-Geol Baek, Jun Seok Kim, 2015 .

Data Mining Approaches for Packaging Yield Prediction in the Post-fabrication Process

Cheong-Sool Park, Jun-Geol Baek, Jun-Seok Kim, 2013, 2013 IEEE International Congress on Big Data.

Yield Prediction Using Support Vectors Based Under-Sampling in Semiconductor Process

Cheong-Sool Park, Jun-Geol Baek, Seung Hwan Park, 2012 .

Principal curve-based monitoring chart for anomaly detection of non-linear process signals

Jun-Geol Baek, S. Park, Cheong-Sool Park, 2016, The International Journal of Advanced Manufacturing Technology.

Under Sampling for Imbalanced Data using Minor Class based SVM (MCSVM) in Semiconductor Process

Seung Hwan Park, Cheong-Sool Park, Jun-Geol Baek, 2014 .