W. Wolz

发表

An optimized electron beam deflection assembly

M. Batinic, K. Helmreich, W. Wolz, 1993 .

Picosecond photoemission sampling for contactless high speed integrated circuit diagnostics

H. Beha, A. Blacha, R. Clauberg, 1988 .

Investigations on chip-internal current contrast imaging and measurement using an electron beam tester

K. Helmreich, W. Wolz, K. Muller-Glaser, 1992 .

AN APPROACH TO CHIP-INTERNAL CURRENT MONITORING AND MEASUREMENT USING AN ELECTRON BEAM TESTER

Klaus D. Müller-Glaser, Klaus Helmreich, Peter Nagel, 1991, 1991, Proceedings. International Test Conference.