H. Chang
发表
T. Ohba,
S. Kodama,
Y. S. Kim,
2018,
2018 13th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT).
J. H. Huang,
Y. H. Chen,
K. Chiang,
2011,
2011 IEEE 61st Electronic Components and Technology Conference (ECTC).
Y. H. Chen,
K. Chiang,
Z. Hsiao,
2009,
2009 59th Electronic Components and Technology Conference.
C. K. Lee,
K. Chiang,
Y. C. Lee,
2021,
IEEE Transactions on Device and Materials Reliability.
C. K. Lee,
Y. J. Huang,
Y. H. Chen,
2012,
2012 IEEE 62nd Electronic Components and Technology Conference.
J. H. Lau,
M. Kao,
J. Lau,
2011,
2011 IEEE 61st Electronic Components and Technology Conference (ECTC).
Kuo-Ning Chiang,
Chang-Chun Lee,
Chin-Chiu Hsia,
2007,
Microelectron. Reliab..
T. Ohba,
T. Ohba,
Y. Mizushima,
2018,
2018 IEEE 68th Electronic Components and Technology Conference (ECTC).
H. Fu,
C. Chiang,
C. Chien,
2012,
2012 7th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT).