Hiroyoshi Suzuki

Statistical evaluation of dynamic junction leakage current fluctuation using a simple arrayed capacitors circuit

Tadahiro Ohmi, Rihito Kuroda, Shigetoshi Sugawa, 2010, 2010 IEEE International Reliability Physics Symposium.

A test structure for statistical evaluation of pn junction leakage current based on CMOS image sensor technology

Tadahiro Ohmi, Rihito Kuroda, Akinobu Teramoto, 2010, 2010 International Conference on Microelectronic Test Structures (ICMTS).