V. Gavrilenko

发表

Observation of modulations in Lyman- α line profiles of multicharged ions in clusters irradiated by femtosecond laser pulses: Effect of a dynamic electric field

A. Faenov, T. Pikuz, I. Skobelev, 2006 .

Reference material for transmission electron microscope calibration

M. N. Filippov, P. A. Todua, Yu. V. Ozerin, 2011 .

Three-Dimensional Reconstruction of the Surfaces of Relief Structures from Stereoscopic Images Obtained in a Scanning Electron Microscope

V. P. Gavrilenko, M. N. Filippov, P. A. Todua, 2015 .

Physical principles of polarization-spectroscopic measurement of electric and magnetic fields in ionized gases

V. Gavrilenko, 1992 .

Use of fluorescence spectroscopy of hydrogen atoms and BH molecules for measurements of electric fields in a plasma

V. Gavrilenko, A. I. Zhuzhunashvili, E. Cherkasova, 2006 .

Observation and Analysis of Strong Oscillating Electric Fields in a ps and fs Laser Plasma by High‐resolution X‐ray Spectroscopy Measurements

A. P. Matafonov, A. Faenov, T. Pikuz, 2006 .

Plasma satellites of X-ray lines of ions in a picosecond laser plasma

A. P. Matafonov, A. Faenov, T. Pikuz, 2004 .

Electron Probe Measurements of Oxide Film Thickness on Silicon Surfaces

M. N. Filippov, V. Gavrilenko, M. Stepovich, 2015, Measurement Techniques.

Determination of the plasma density in a current sheet from the profiles of the HeII 6560-Å and Hα spectral lines

A. Frank, V. Gavrilenko, N. P. Kyrie, 2000 .

Use of fluorescence spectroscopy of CS for measurements of electric fields in a discharge plasma

H. Kunze, S. Maurmann, V. Gavrilenko, 1996 .

Effect of an electric field and collisions on the laser-induced fluorescence of CS molecules

H. Kunze, S. Maurmann, V. Gavrilenko, 1996 .

New effect in Stark spectroscopy of atomic hydrogen: dynamic resonance

V. Gavrilenko, E. Oks, 1981 .

Data on cross-sections for Stark broadening of radio recombination lines: non-perturbative all-multipole classical calculations

V. Gavrilenko, E. Oks, 2007 .

Laser-spectroscopic methods for diagnostics of electric fields in plasma (review)

V. Gavrilenko, 2006 .

Theory for diagnostics of oscillating electric fields in a plasma on the base of fluorescence spectroscopy of diatomic molecules

V. Gavrilenko, 1996 .

Progress in plasma spectroscopic diagnostics based on Stark effect in atoms and molecules

V. N. Ochkin, S. N. Tskhai, V. P. Gavrilenko, 2002, Other Conferences.

The physical bases of spectroscopic measurements of electrical fields in a plasma

V. Gavrilenko, 1992 .

Natural oxide thickness measurements on the test silicon relief pitch structure

V. P. Gavrilenko, M. N. Filippov, A. V. Rakov, 2013, Other Conferences.

Generation of coherent IR light on a dipole-forbidden molecular transition with biharmonic pumping in a static electric field

S. Savinov, V. Ochkin, S. Tskhai, 1992 .

X-ray-line plasma satellites of ions in a dense plasma produced by a picosecond laser pulse

A. P. Matafonov, A. Faenov, T. Pikuz, 2006 .

Proposals for Remote Sensing of Electric Fields under Thunderclouds Using Laser Spectroscopy

M. Maeda, V. Gavrilenko, K. Muraoka, 2000 .

Hydrogenlike ion spectrum in a field of elliptically-polarized electromagnetic radiation: Diagnostics possibilities for Tokamaks with UHF heating

V. Gavrilenko, E. Oks, 1983 .

Test objects for calibration of SEMs and AFMs operating at the nanoscale

V. P. Gavrilenko, Yu. A. Novikov, A. V. Rakov, 2010, Photonics Europe.

Test object of the linewidth with a trapezoidal profile and three certified sizes for an SEM and AFM

V. P. Gavrilenko, Yu. A. Novikov, A. V. Rakov, 2009 .

Test object for calibrating the transmission electron microscope

M. N. Filippov, P. A. Todua, Yu. V. Ozerin, 2013 .

New reference material for transmission electron microscope calibration

V. P. Gavrilenko, M. N. Filippov, A. V. Rakov, 2012, Other Conferences.

Nanometrology as a key part of the infrastructure of nanotechnology

P. A. Todua, V. Gavrilenko, 2013, Nanotechnologies in Russia.

Specific Features of Stark Broadening of Helium-Like Multi-Charged Ion Spectral Lines

Y. Ispolatov, V. Gavrilenko, E. Oks, 1988 .

Measurement of the native oxide thickness on a reference relief pitch structure on a single-crystal silicon substrate

P. A. Todua, V. B. Mityukhlyaev, V. Gavrilenko, 2013 .

Measurement of the native oxide thickness on a reference relief pitch structure on a single-crystal silicon substrate

P. A. Todua, V. B. Mityukhlyaev, V. Gavrilenko, 2013, Russian microelectronics.

Anomalous Electric Fields Inside a Dense Plasma of a Current Sheet

A. Frank, V. Gavrilenko, E. Oks, 1996 .

Electron Probe Measurements of Oxide Film Thickness on Silicon Surfaces

M. N. Filippov, P. A. Todua, V. B. Mityukhlyaev, 2015 .

X-ray-line plasma satellites of ions in solid target plasmas produced by picosecond laser pulse

A. P. Matafonov, A. Faenov, T. Pikuz, 2003 .

Calibration of a scanning electron microscope in the wide range of magnifications for the microscope operation in the integrated circuit production line

V. P. Gavrilenko, Yu. A. Novikov, A. V. Rakov, 2009, Advanced Lithography.