J. Walraven

发表

J. Soden, E. I. Cole, E.I. Cole, 2001, 2001 Electrical Overstress/Electrostatic Discharge Symposium.

R. Maboudian, R. Maboudian, J. Redmond, 2003, Journal of Microelectromechanical Systems.

Jeremy A. Walraven, J. Walraven, 2005, Microelectron. Reliab..

Jeremy A. Walraven, J. Walraven, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Jeremy A. Walraven, Danelle M. Tanner, Thomas J. Headley, 1999, Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components.

M. P. Boer, M. Dugger, J. Sniegowski, 2000 .

W. M. Miller, D. Laván, M. Dugger, 2000, 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).

Jeremy A. Walraven, James G. Fleming, Danelle M. Tanner, 1999 .

Jeremy A. Walraven, Kenneth A. Peterson, Danelle M. Tanner, 2000 .

T. B. Parson, M. Jenkins, A. Corwin, 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..

James G. Fleming, Jeremy A. Walraven, Seethambal S. Mani, 2000, SPIE MOEMS-MEMS.

Jeremy A. Walraven, J. Walraven, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Jeremy A. Walraven, Michael S. Baker, Richard A. Plass, 2004 .

M. Jordan, D. Perry, J. Walraven, 2022, Microscopy and Microanalysis.

Matthew Robert Brake, Jeremy A. Walraven, J. W. Wittwer, 2008 .

Jeremy A. Walraven, Danelle M. Tanner, F. W. Sexton, 2003, SPIE MOEMS-MEMS.

D. M. Tanner, T. B. Parson, A. D. Corwin, 2007, Microelectron. Reliab..

Jeremy A. Walraven, Maarten P. de Boer, David L. Luck, 2001, SPIE MOEMS-MEMS.

D. M. Tanner, Jeremy A. Walraven, Danelle M. Tanner, 1999, 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).