J. Walraven
发表
J. Soden,
E. I. Cole,
E.I. Cole,
2001,
2001 Electrical Overstress/Electrostatic Discharge Symposium.
R. Maboudian,
R. Maboudian,
J. Redmond,
2003,
Journal of Microelectromechanical Systems.
Jeremy A. Walraven,
J. Walraven,
2005,
Microelectron. Reliab..
A. Oates,
P. Perdu,
J. Walraven,
2016
.
Jeremy A. Walraven,
J. Walraven,
2003,
International Test Conference, 2003. Proceedings. ITC 2003..
Jeremy A. Walraven,
Danelle M. Tanner,
Thomas J. Headley,
1999,
Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components.
M. P. Boer,
M. Dugger,
J. Sniegowski,
2000
.
W. M. Miller,
D. Laván,
M. Dugger,
2000,
2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).
Jeremy A. Walraven,
James G. Fleming,
Danelle M. Tanner,
1999
.
Jeremy A. Walraven,
Kenneth A. Peterson,
Danelle M. Tanner,
2000
.
T. B. Parson,
M. Jenkins,
A. Corwin,
2005,
2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..
James G. Fleming,
Jeremy A. Walraven,
Seethambal S. Mani,
2000,
SPIE MOEMS-MEMS.
Jeremy A. Walraven,
J. Walraven,
2003,
International Test Conference, 2003. Proceedings. ITC 2003..
Jeremy A. Walraven,
Michael S. Baker,
Richard A. Plass,
2004
.
M. Jordan,
D. Perry,
J. Walraven,
2022,
Microscopy and Microanalysis.
Matthew Robert Brake,
Jeremy A. Walraven,
J. W. Wittwer,
2008
.
Jeremy A. Walraven,
Danelle M. Tanner,
F. W. Sexton,
2003,
SPIE MOEMS-MEMS.
D. M. Tanner,
T. B. Parson,
A. D. Corwin,
2007,
Microelectron. Reliab..
Jeremy A. Walraven,
Maarten P. de Boer,
David L. Luck,
2001,
SPIE MOEMS-MEMS.
D. M. Tanner,
Jeremy A. Walraven,
Danelle M. Tanner,
1999,
1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296).