D. Tanner

发表

Human Body Model, Machine Model, and Charge Device Model ESD testing of surface micromachined microelectromechanical systems (MEMS)

J. Soden, E. I. Cole, E.I. Cole, 2001, 2001 Electrical Overstress/Electrostatic Discharge Symposium.

Failure modes in surface micromachined microelectromechanical actuators

M. S. Rodgers, J. Sniegowski, P. Clews, 1998, 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).

THE CHALLENGE OF RELIABILITY C0&980924- IN MEMS COMMERCIALIZATION

W. M. Miller, D. Tanner, 2008 .

Wear Mechanisms in a Reliability Methodology (Invited)

M. Dugger, D. Tanner, 2003 .

Reaction ^ C（^ O,α）^ Mg Leading to Nuclear Molecular Resonances

R. Tribble, D. Tanner, T. Shimoda, 1979 .

J 57 + Au ) 2 # o & + 2 / z L Chemical Vapor Deposition Coating for Micromachines 3

M. P. Boer, J. Sniegowski, J. Fleming, 2022 .

Comparative study of compound components in 14N(14N, α) and 12C(16O, α) reactions

Y. Lui, D. Tanner, N. Takahashi, 1982 .

Optical-Model Parameters for the C-12(li-7,li-7)c-12 Reaction at 63 and 78.7 Mev

A. Zeller, R. Tribble, Y. Lui, 1980 .

Observation of nuclear molecular resonances through the (16O, α) reaction on light nuclei

Y. Lui, D. Tanner, N. Takahashi, 1982 .

Energy dependence of the 12C(16O, α) reaction

Y. Lui, D. Tanner, N. Takahashi, 1983 .

A. Zeller, R. Tribble, D. Tanner, 1980 .

Wear Mechanisms in a Reliability Methodology

D. M. Tanner, Danelle M. Tanner, Michael Thomas Dugger, 2003, SPIE MOEMS-MEMS.

Failure analysis of worn surface-micromachined microengines

Jeremy A. Walraven, Danelle M. Tanner, Thomas J. Headley, 1999, Photonics West - Micro and Nano Fabricated Electromechanical and Optical Components.

Frequency dependence of the lifetime of a surface micromachined microengine driving a load

D. M. Tanner, Kenneth A. Peterson, Paiboon Tangyunyong, 1999 .

Chemical vapor deposition coating for micromachines

M. P. Boer, M. Dugger, J. Sniegowski, 2000 .

Effect of W coating on microengine performance

W. M. Miller, D. Laván, M. Dugger, 2000, 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059).

Selective W for Coating and Releasing MEMS Devices

Jeremy A. Walraven, James G. Fleming, Danelle M. Tanner, 1999 .

MEMS Reliability: Infrastructure, Test Structures, Experiments, and Failure Modes

Jeremy A. Walraven, Kenneth A. Peterson, Danelle M. Tanner, 2000 .

MEMS reliability: Where are we now?

D. M. Tanner, D. Tanner, 2009, Microelectron. Reliab..

Accelerating aging failures in MEMS devices

T. B. Parson, M. Jenkins, A. Corwin, 2005, 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual..

Electrical and chemical characterization of FIB-deposited insulators

D. M. Tanner, Diane K. Stewart, Ann N. Campbell, 1997 .

Failure analysis of tungsten-coated polysilicon micromachined microengines

James G. Fleming, Jeremy A. Walraven, Seethambal S. Mani, 2000, SPIE MOEMS-MEMS.

Anodic oxidation-induced delamination of the SUMMiT poly 0 to Silicon Nitride Interface

Jeremy A. Walraven, Danelle M. Tanner, F. W. Sexton, 2003, SPIE MOEMS-MEMS.

Science-based MEMS reliability methodology

D. M. Tanner, T. B. Parson, A. D. Corwin, 2007, Microelectron. Reliab..

The effect of frequency on the lifetime of a surface micromachined microengine driving a load

D. M. Tanner, Kenneth A. Peterson, Paiboon Tangyunyong, 1998, 1998 IEEE International Reliability Physics Symposium Proceedings. 36th Annual (Cat. No.98CH36173).