Yangbo Zhou

发表

Novel organic photovoltaic polymer blends: A rapid, 3-dimensional morphology analysis using backscattered electron imaging in the scanning electron microscope

David G Lidzey, M. Dapor, Q. Wan, 2017 .

Plasma Treatment of Ultrathin Layered Semiconductors for Electronic Device Applications

Hongzhou Zhang, Yangbo Zhou, D. Kelly, 2021 .

Low-temperature electrical conduction of plasma-treated bilayer MoS_2

Hongzhou Zhang, Yangbo Zhou, Jakub Jadwiszczak, 2018 .

Programmable graphene doping via electron beam irradiation.

Y. Chen, Hongzhou Zhang, Yangbo Zhou, 2016, Nanoscale.

New perspectives on nano-engineering by secondary electron spectroscopy in the helium ion and scanning electron microscope

R. Masters, C. Holland, C. Rodenburg, 2018 .

Sub-5 nm graphene nanopore fabrication by nitrogen ion etching induced by a low-energy electron beam

J. Coleman, A. O’Neill, C. Rodenburg, 2016, Nanotechnology.

Helium Ion Microscopy for Graphene Characterization and Modification

Hongzhou Zhang, D. Fox, Daniel Fox, 2015 .

High throughput secondary electron imaging of organic residues on a graphene surface

Hongzhou Zhang, Yangbo Zhou, P. Maguire, 2014, Scientific Reports.

Precise milling of nano-gap chains in graphene with a focused helium ion beam

H. Mizuta, M. Muruganathan, Hongzhou Zhang, 2016, Nanotechnology.

Helium Ion Microscopy for Two-Dimensional Materials

Hongzhou Zhang, D. Fox, Yangbo Zhou, 2016 .

Nanopatterning and Electrical Tuning of MoS2 Layers with a Subnanometer Helium Ion Beam.

J. Coleman, J. Donegan, G. Duesberg, 2015, Nano letters.

MoS2 Memtransistors Fabricated by Localized Helium Ion Beam Irradiation.

Jun Xu, Zhi-Min Liao, Rui Zhu, 2019, ACS nano.

Neuromorphic MoS2 memtransistors fabricated by localised helium ion beam irradiation.

Jun Xu, Zhi-Min Liao, Rui Zhu, 2018, 1811.09545.

Oxide-mediated recovery of field-effect mobility in plasma-treated MoS2

A. L. Bradley, Conor P. Cullen, M. Ferreira, 2017, Science Advances.

Application of low-voltage backscattered electron imaging to the mapping of organic photovoltaic blend morphologies

David G Lidzey, M. Dapor, Q. Wan, 2015, Journal of Physics: Conference Series.

Defect sizing, separation, and substrate effects in ion-irradiated monolayer two-dimensional materials

Conor P. Cullen, G. Duesberg, J. McManus, 2017, Physical Review B.

Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene

M. Dapor, R. Masters, C. Rodenburg, 2016, Scientific Reports.

Helium Ion Microscopy for Graphene Characterization and Modification

Hongzhou Zhang, D. Fox, Yangbo Zhou, 2015 .

Helium ion microscopy of graphene: beam damage, image quality and edge contrast

G. Duesberg, A. O’Neill, D. Fox, 2013, Nanotechnology.