G. Libera

Engineering of chalcogenide materials for embedded applications of Phase Change Memory

Elisabetta Palumbo, R. Annunziata, Paola Zuliani, 2015 .

Detection and localization of gate oxide shorts in MOS transistors by optical-beam-induced current

Enrico Zanoni, Giorgio Spiazzi, C. Canali, 1991 .

Annealing of Hot Carrier Damaged Double Metal MOSFET

R. Annunziata, G. Dalla Libera, R. Annunziata, 1989, ESSDERC '89: 19th European Solid State Device Research Conference.

Physical characterization of hot-electron-induced MOSFET degradation through an improved approach to the charge-pumping technique

C. Bergonzoni, Giovanna Dalla Libera, C. Bergonzoni, 1992 .