E. Seebacher

发表

E. Seebacher, D. Ioan, G. Ciuprina, 2006, IEEE Transactions on Magnetics.

Schloss Premstaetten, E. Seebacher, 2005 .

I. Starkov, T. Grasser, C. Jungemann, 2010, 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

W. Posch, K. Molnár, E. Seebacher, 2011 .

M. Bucher, E. Seebacher, N. Mavredakis, 2014, 2014 29th International Conference on Microelectronics Proceedings - MIEL 2014.

M. Bucher, E. Seebacher, T. Gneiting, 2015, 2015 International Conference on Noise and Fluctuations (ICNF).

E. Seebacher, W.C. Pflanzl, E. Seebacher, 2007, 2007 14th International Conference on Mixed Design of Integrated Circuits and Systems.

E. Seebacher, T. Gneiting, A. Bazigos, 2013, IEEE Transactions on Electron Devices.

E. Seebacher, W. Posch, C. Murhammer, 2012, IEEE Transactions on Semiconductor Manufacturing.

Tibor Grasser, Oliver Triebl, Hajdin Ceric, 2010, Microelectronics and reliability.

E. Seebacher, T. Grasser, H. Ceric, 2010, 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits.

V. Vescoli, S. Carniello, E. Seebacher, 2016 .

K. Chatty, D. Harame, E. Seebacher, 2010, 2010 22nd International Symposium on Power Semiconductor Devices & IC's (ISPSD).

Maher Kayal, Camillo Stefanucci, Ramy Iskander, 2015, 2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW).

E. Seebacher, Z. Huszka, K. Molnar, 2003, 2003 Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440).

E. Seebacher, R. Minixhofer, M. Knaipp, 2004, IEEE Transactions on Electron Devices.

D. Céli, E. Seebacher, Z. Huszka, 2011, IEEE Transactions on Electron Devices.

Tibor Grasser, Hajdin Ceric, C. Jungemann, 2011, Microelectron. Reliab..