C. Varker

发表

SEM Methods for the Characterization of Semiconductor Materials and Devices

C. Varker, 1979 .

Laser Processing of Ion Implanted Semiconductor Materials for Device Applications

S. Wilson, C. Varker, W. Paulson, 1981, IEEE Transactions on Nuclear Science.

DEEP LEVELS ASSOCIATED WITH OXYGEN PRECIPITATION IN CZ SILICON AND CORRELATION WITH MINORITY CARRIER LIFETIMES.

R. Carpenter, J. Whitfield, C. Varker, 1985 .

Experimental techniques for the plastic deformation of metal foils in the electron microscope

C. Varker, L. Cinquina, H. Wilsdorf, 1960 .

The Erosion of Materials in Molten Silicon

C. Varker, R. Chaney, 1976 .

The dissolution of fused silica in molten silicon

C. Varker, R. Chaney, 1976 .

Oxidation‐induced stacking faults in silicon. I. Nucleation phenomenon

K. Ravi, C. Varker, 1974 .

On the use of the scanning electron microscope for kinetic studies

K. Ravi, C. Varker, 1973 .

An electromigration model that includes the effects of microstructure and temperature on mass transport

K. Fu, C. Varker, M. L. Dreyer, 1993 .

Comments on the distinction between ``striations'' and ``swirls'' in silicon

K. Ravi, C. Varker, 1974 .

Oxidation‐induced stacking faults in silicon. II. Electrical effects in P N diodes

K. Ravi, C. Varker, 1974 .

Oxygen Precipitation in Silicon - Its Effects on Minority Carrier Recombination and Generation Lifetime

J. Whitfield, P. Fejes, C. Varker, 1982 .

Transient Annealing of Boron Implanted Devices

S. R. Wilson, W. Paulson, R. Reuss, 1983 .

Recombination lifetime using the pulsed MOS capacitor

D. Schroder, J. Whitfield, C. Varker, 1984, IEEE Transactions on Electron Devices.

Electrically Active Stacking Faults in Silicon

K. V. Ravi, C. E. Volk, C. J. Varker, 1973 .