P. C. Russell

The apparent degradation of mobility in field-effect-device channels

B. Jones, B K Jones, P. C. Russell, 1986 .

Reliability testing by precise electrical measurement

A. P. Dorey, B. K. Jones, Andrew M. D. Richardson, 1988, International Test Conference 1988 Proceeding@m_New Frontiers in Testing.

Capacitance measurements on AuCd1−yZnyS polycrystalline schottky diodes

B. Jones, P. C. Russell, A. Mzerd, 1990 .

1/f noise in Ohmic MOS inversion layers

B. Jones, P. C. Russell, S. Hayat, 1988 .

Characterization of Electron Traps in AuCd1−yZnyS Polycrystalline Schottky Diodes by Capacitance Transient Measurements

B. Jones, P. C. Russell, A. Mzerd, 1990 .