C. Fleischmann
发表
W. Vandervorst,
D. Larson,
P. Heide,
2020
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H. Bender,
M. Caymax,
M. Heyns,
2009,
2009 IEEE International Electron Devices Meeting (IEDM).
B. Beckhoff,
E. Rühl,
G. Ulm,
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Optics express.
T. Conard,
W. Vandervorst,
R. Havelund,
2016
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R. Loo,
B. Beckhoff,
M. Steinert,
2021,
Small.
M. Perego,
B. Beckhoff,
W. Vandervorst,
2018
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B. Beckhoff,
C. Seim,
A. Dehlinger,
2018,
Microscopy and Microanalysis.
Brian W. Geiser,
D. Haley,
M. Dialameh,
2022,
Journal of Physics D: Applied Physics.
A. Franquet,
T. Conard,
R. Havelund,
2014
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R. Loo,
W. Vandervorst,
F. Gencarelli,
2015
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B. Douhard,
Andreas Fuhrer,
C. Fleischmann,
2020
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A. Hikavyy,
E. Rosseel,
K. Devriendt,
2019,
2019 IEEE International Electron Devices Meeting (IEDM).
W. Vandervorst,
P. Ferrari,
J. Bogdanowicz,
2019,
Ultramicroscopy.
W. Vandervorst,
P. Ferrari,
C. Fleischmann,
2022,
Journal of Applied Physics.
O. Richard,
T. Ivanov,
C. Adelmann,
2019,
ACS Applied Electronic Materials.
C. Adelmann,
T. Conard,
W. Vandervorst,
2016
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H. Boyen,
K. Temst,
B. Beckhoff,
2013
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H. Boyen,
K. Temst,
B. Beckhoff,
2013
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W. Vandervorst,
M. Thuvander,
C. Fleischmann,
2022,
Ultramicroscopy.
J. Bogdanowicz,
C. Fleischmann,
W. Vandervorst,
2018,
Journal of Applied Physics.
W. Vandervorst,
K. Paredis,
C. Fleischmann,
2018,
Ultramicroscopy.
O. Richard,
H. Bender,
K. Temst,
2016
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W. Vandervorst,
N. D. Nguyen,
J. Deschanvres,
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Scientific reports.
K. Temst,
T. Conard,
J. Locquet,
2014
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W. Vandervorst,
L. Arnoldi,
F. Vurpillot,
2017,
Ultramicroscopy.
A. Franquet,
U. Celano,
W. Vandervorst,
2017
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W. Vandervorst,
J. Bogdanowicz,
C. Fleischmann,
2018,
Ultramicroscopy.
W. Vandervorst,
J. Bogdanowicz,
C. Fleischmann,
2022,
Microscopy and Microanalysis.
W. Vandervorst,
J. Bogdanowicz,
C. Fleischmann,
2022,
Microscopy and Microanalysis.
Sylvain Barraud,
Wilfried Vandervorst,
Didier Blavette,
2017
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W. Vandervorst,
D. Larson,
J. Bunton,
2021,
Microscopy and Microanalysis.
C. Merckling,
K. Temst,
S. Sioncke,
2012
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K. Temst,
B. Beckhoff,
S. Sioncke,
2011
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Marc Meuris,
Philipp Hönicke,
André Vantomme,
2011
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A. Franquet,
T. Conard,
W. Vandervorst,
2018,
Applications of Surface Science.
A. Franquet,
T. Conard,
W. Vandervorst,
2020,
Analytical chemistry.
T. Conard,
W. Vandervorst,
P. Eyben,
2016,
Nanoscale.
The influence of interface roughness on the magnetic properties of exchange biased CoO/Fe thin films
K. Temst,
A. Vantomme,
R. Steitz,
2010
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K. Temst,
K. Temst,
J. Locquet,
2014,
ACS applied materials & interfaces.
B. Douhard,
Andreas Fuhrer,
C. Fleischmann,
2020,
Nature Electronics.
A. Franquet,
M. Caymax,
M. Heyns,
2011
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I. De Wolf,
W. Vandervorst,
P. Favia,
2022,
Journal of Applied Physics.
C. Merckling,
K. Temst,
B. Beckhoff,
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K. Temst,
B. Beckhoff,
S. Sioncke,
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C. Detavernier,
K. Temst,
A. Vantomme,
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W. Vandervorst,
K. Paredis,
C. Fleischmann,
2020
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W. Vandervorst,
J. Bogdanowicz,
J. Houard,
2018,
Ultramicroscopy.
W. Vandervorst,
L. Arnoldi,
P. Heide,
2018
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A. Hikavyy,
A. Veloso,
R. Loo,
2023,
Advanced Lithography.
M. Perego,
B. Beckhoff,
W. Vandervorst,
2018
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P. Hönicke,
C. Fleischmann,
Matthias A. Müller,
2014,
Materials.
Geert Hellings,
Eddy Simoen,
Niamh Waldron,
2017
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W. Vandervorst,
C. Freysoldt,
J. Scheerder,
2021,
Microscopy and Microanalysis.
K. Temst,
J. Locquet,
A. Vantomme,
2014,
ACS applied materials & interfaces.