Huaxing Tang

发表

Improved volume diagnosis throughput using dynamic design partitioning

Wu-Tung Cheng, Yu Huang, Sudhakar M. Reddy, 2012, 2012 IEEE International Test Conference.

On reducing test data volume and test application time for multiple scan chain designs

Irith Pomeranz, Sudhakar M. Reddy, Huaxing Tang, 2003, International Test Conference, 2003. Proceedings. ITC 2003..

Employing the STDF V4-2007 Standard for Scan Test Data Logging

Huaxing Tang, M. Seuring, M. Braun, 2012, IEEE Design & Test of Computers.

On testing of interconnect open defects in combinational logic circuits with stems of large fanout

I. Pomeranz, Huaxing Tang, S.M. Reddy, 2002, Proceedings. International Test Conference.

On Using Design Partitioning to Reduce Diagnosis Memory Footprint

Sudhakar M. Reddy, Wu-Tung Cheng, Brady Benware, 2011, 2011 Asian Test Symposium.

Improving Performance of Effect-Cause Diagnosis with Minimal Memory Overhead

S.M. Reddy, Wu-Tung Cheng, Wei Zou, 2007, 16th Asian Test Symposium (ATS 2007).

Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement

Janusz Rajski, Manish Sharma, Martin Keim, 2007, 12th IEEE European Test Symposium (ETS'07).

Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree

Sudhakar M. Reddy, Wu-Tung Cheng, Xun Tang, 2011, 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems.

Distributed dynamic partitioning based diagnosis of scan chain

Yu Huang, Sudhakar M. Reddy, Wu-Tung Cheng, 2013, 2013 IEEE 31st VLSI Test Symposium (VTS).

Diagnose Failures Caused by Multiple Locations at a Time

Yu Huang, Yu Hu, Xiaowei Li, 2014, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.

A case study for using dynamic partitioning based solution in volume diagnosis

Tao Wang, Wu Yang, Junna Zhong, 2018, 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE).

Cell-aware diagnosis: Defective inmates exposed in their cells

Friedrich Hapke, Peter C. Maxwell, Huaxing Tang, 2016, 2016 21th IEEE European Test Symposium (ETS).

On efficient X-handling using a selective compaction scheme to achieve high test response compaction ratios

Irith Pomeranz, Sudhakar M. Reddy, Janusz Rajski, 2005, 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design.

Using Cell Aware Diagnostic Patterns to Improve Diagnosis Resolution for Cell Internal Defects

Arvind Jain, Huaxing Tang, Sanil Kumark Pillai, 2017, 2017 IEEE 26th Asian Test Symposium (ATS).

Diagnosing Cell Internal Defects Using Analog Simulation-Based Fault Models

Friedrich Hapke, Thomas Herrmann, Michael Reese, 2014, 2014 IEEE 23rd Asian Test Symposium.

On methods to improve location based logic diagnosis

Sudhakar M. Reddy, Wu-Tung Cheng, Wei Zou, 2006, 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06).

A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis

Janusz Rajski, Manish Sharma, Nagesh Tamarapalli, 2006, 2006 IEEE International Test Conference.

Defect aware test patterns

Gang Chen, Irith Pomeranz, Sudhakar M. Reddy, 2005, Design, Automation and Test in Europe.

Interconnect open defect diagnosis with minimal physical information

Sudhakar M. Reddy, Chen Liu, Wu-Tung Cheng, 2007, 2007 IEEE International Test Conference.

Diagnosing timing related cell internal defects for FinFET technology

Friedrich Hapke, Wu-Tung Cheng, Brady Benware, 2015, VLSI Design, Automation and Test(VLSI-DAT).

Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data

Wu-Tung Cheng, Manish Sharma, David Abercrombie, 2008, 2008 IEEE International Test Conference.

Hyperactive Faults Dictionary to Increase Diagnosis Throughput

Sudhakar M. Reddy, Wu-Tung Cheng, Wei Zou, 2008, 2008 17th Asian Test Symposium.

Scan Chain Diagnosis Based on Unsupervised Machine Learning

Yu Huang, Wu-Tung Cheng, Brady Benware, 2017, 2017 IEEE 26th Asian Test Symposium (ATS).

Deterministic IDDQ diagnosis using a net activation based model

Wu-Tung Cheng, Ralf Arnold, Huaxing Tang, 2011, 2011 IEEE International Test Conference.

Speeding Up Effect-Cause Defect Diagnosis Using a Small Dictionary

Sudhakar M. Reddy, Wu-Tung Cheng, Huaxing Tang, 2007, 25th IEEE VLSI Test Symposium (VTS'07).