Brady Benware

Improved volume diagnosis throughput using dynamic design partitioning

Wu-Tung Cheng, Yu Huang, Sudhakar M. Reddy, 2012, 2012 IEEE International Test Conference.

Case study of scan chain diagnosis and PFA on a low yield wafer

Wu-Tung Cheng, Feng-Ming Kuo, Brady Benware, 2010, 2010 IEEE International Test Conference.

Effectiveness comparisons of outlier screening methods for frequency dependent defects on complex ASICs

W. Robert Daasch, Brady Benware, Robert Madge, 2003, Proceedings. 21st VLSI Test Symposium, 2003..

In search of the optimum test set - adaptive test methods for maximum defect coverage and lowest test cost

Brady Benware, C. Schuermyer, Robert Madge, 2004 .

Defect screening using independent component analysis on I/sub DDQ/

W. Robert Daasch, W. R. Daasch, Brady Benware, 2005, 23rd IEEE VLSI Test Symposium (VTS'05).