Y. Deshayes
发表
L. Béchou,
F. Verdier,
Y. Ousten,
2021,
Advanced Laser Diode Reliability.
L. Béchou,
O. Gilard,
Y. Ousten,
2011,
IEEE Transactions on Device and Materials Reliability.
Lionel Canioni,
Arnaud Royon,
Thierry Cardinal,
2010,
Advanced materials.
L. Béchou,
Y. Deshayes,
R. Baillot,
2019,
2019 Global LIFI Congress (GLC).
L. Béchou,
Y. Ousten,
S. Joly,
2015,
IEEE Transactions on Device and Materials Reliability.
M. Krakowski,
L. Béchou,
A. Larrue,
2017,
2017 IEEE High Power Diode Lasers and Systems Conference (HPD).
N. Zerounian,
L. Béchou,
F. Aniel,
2006,
IPFA 2006.
L. Canioni,
P. Mounaix,
T. Cardinal,
2013,
Optics express.
K. Hinzer,
V. Aimez,
M. Volatier,
2021,
Progress in Photovoltaics: Research and Applications.
M. Vanzi,
L. Béchou,
F. Verdier,
1990,
2013 IEEE 20th Symposium on Communications and Vehicular Technology in the Benelux (SCVT).
B. Desbat,
L. Hirsch,
Y. Deshayes,
1999
.
L. S. How,
L. Béchou,
O. Gilard,
2009
.
Y. Ousten,
Y. Deshayes,
L. Bechou,
2010,
IEEE Transactions on Device and Materials Reliability.
Yannick Deshayes,
Laurent Béchou,
A. Royon,
2013,
Microelectron. Reliab..
Jean-Yves Delétage,
Yves Danto,
Frédéric Verdier,
2003,
Microelectron. Reliab..
Laurent Bechou,
Y. Danto,
Y. Deshayes,
2005
.
Y. Ousten,
R. Baillot,
L. Béchou,
2011,
Optical Engineering + Applications.
I. Pianet,
F. Voillot,
C. Armand,
2010,
Microelectron. Reliab..
Frédéric Verdier,
Yves Danto,
J.-Y. Deltage,
2002,
Proceedings of the 9th International Symposium on the Physical and Failure Analysis of Integrated Circuits (Cat. No.02TH8614).
Y. Deshayes,
2012
.
Daniel T Cassidy,
Chadwick K. Hall,
A. Kohl,
2013,
Optics letters.
Laurent Bechou,
Yannick Deshayes,
Olivier Gilard,
2008
.