Frédéric Darracq

发表

Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell

Philippe Perdu, Dean Lewis, Vincent Pouget, 2013, Microelectron. Reliab..

A Review and some Future Prospects on Laser-Based Techniques for Single-Event Effects Testing and Analysis

Dean Lewis, Pascal Fouillat, Vincent Pouget, 2005 .

A new laser system for X-rays flashes sensitivity evaluation

Hervé Lapuyade, Yann Deval, Dean Lewis, 2001, Proceedings Seventh International On-Line Testing Workshop.

Comprehensive study into underlying mechanisms of anomalous gate leakage degradation in GaN high electron mobility transistors

Nathalie Labat, Nathalie Malbert, Arnaud Curutchet, 2018, 2018 IEEE International Reliability Physics Symposium (IRPS).

Application of various optical techniques for ESD defect localization

André Touboul, Philippe Perdu, Dean Lewis, 2006, Microelectron. Reliab..

Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects

Hervé Lapuyade, Nadine Buard, Thierry Carrière, 2003, Microelectron. Reliab..

Art Painting Diagnostic Before Restoration with Terahertz and Millimeter Waves

Patrick Mounaix, Hugo Balacey, Frédéric Darracq, 2017 .

A comprehensive study of the application of the EOP techniques on bipolar devices

Philippe Perdu, Dean Lewis, Kevin Sanchez, 2014, Microelectron. Reliab..

Laser cross section measurement for the evaluation of single-event effects in integrated circuits

Hervé Lapuyade, Dean Lewis, Pascal Fouillat, 2000 .

Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing

Dean Lewis, Pascal Fouillat, Vincent Pouget, 2007 .

Ultrafast nonlinear optics in gas-filled hollow -core photonic crystal fibers

F. Fauquet, Patrick Mounaix, Damien Bigourd, 2020 .

Optimizing Pulsed OBIC Technique for ESD Defect Localization

Philippe Perdu, Dean Lewis, Nicolas Guitard, 2007 .

Backside SEU laser testing for commercial off-the-shelf SRAMs

Hervé Lapuyade, Nadine Buard, Pascal Fouillat, 2002 .