Tsung-Yu Yang

Highly Reliable Multilevel and 2-bit/cell Operation of Wrapped Select Gate (WSG) SONOS Memory

Tien-Sheng Chao, Chao-Sung Lai, Wen-Luh Yang, 2007, IEEE Electron Device Letters.

Optimized ONO thickness for multi-level and 2-bit/cell operation for wrapped-select-gate (WSG) SONOS memory

Tien-Sheng Chao, Chao-Sung Lai, Wen-Luh Yang, 2008 .

Impact of High-$\kappa$ Offset Spacer in 65-nm Node SOI Devices

Chien-Hung Wu, Tien-Sheng Chao, Shui-Jinn Wang, 2007, IEEE Electron Device Letters.