Benjamin French

发表

The prediction accuracy of dynamic mixed-effects models in clustered data

Brian S. Finkelman, Benjamin French, Stephen E. Kimmel, 2016, BioData Mining.

Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability

Markus G. Kuhn, Xin Liu, Patrick M. Lenahan, 2016, Microelectron. Reliab..

A high Froude number time-domain strip theory for ship motion predictions in irregular waves

Benjamin French, Giles Thomas, Mike Thomas Davis, 2012 .

The Impact of an Automated Early Warning System for Sepsis

Benjamin French, Gordon Tait, Craig A. Umscheid, 2013, AMIA.

Valence and conduction band offsets at low-k a-SiOxCy:H/a-SiCxNy:H interfaces

Benjamin French, Justin Brockman, Marc French, 2014 .

Detection of surface electronic defect states in low and high-k dielectrics using reflection electron energy loss spectroscopy

Benjamin French, Sean W. King, S. King, 2013 .

Valence and conduction band offsets at amorphous hexagonal boron nitride interfaces with silicon network dielectrics

Anthony N. Caruso, Benjamin French, Justin Brockman, 2014 .

X-ray photoelectron spectroscopy measurement of the Schottky barrier at the SiC(N)/Cu interface

Benjamin French, Marc French, Sean W. King, 2011 .

Detection of defect states in low-k dielectrics using reflection electron energy loss spectroscopy

Benjamin French, Sean W. King, S. King, 2013 .

X-ray photoelectron spectroscopy investigation of the Schottky barrier at low-k a-SiO(C):H/Cu interfaces

Benjamin French, Marc French, Sean W. King, 2011 .