Andreas Hollmann

Concepts for nondestructive and depth-resolved X-ray residual stress analysis in the near-surface region of nearly single crystalline materials with mosaic structure

M. Klaus, C. Genzel, M. Meixner, 2021, Journal of applied crystallography.

Stability and residual stresses of sputtered wurtzite AlScN thin films

M. Caro, M. Klaus, C. Genzel, 2021, Physical Review Materials.